Determination of Rare Earth Elements in Biological and Mineral Apatite by EPMA and LAMP-ICP-MS
26
Citation
22
Reference
10
Related Paper
Citation Trend
Keywords:
Neutron Activation Analysis
Microanalysis
Electron probe microanalysis
EMPA
Rare-earth element
Abstract A method is described to measure composition profiles of layer systems on substrates by electron probe microanalysis with an improved effective spatial resolution down to 0.1 μm. The resolution problem in microanalysis of angle lapped layers and the related experimental problems are discussed and examples of composition profile measurements at GaAs‐Al x Ga 1– x As double‐heterostructures are presented.
Microanalysis
Electron probe microanalysis
Cite
Citations (0)