Abstract In this work, a kind of thin K‐type thermocouple and self‐developed CAS‐I sealant were used to assembly solid oxide fuel cell (SOFC) stacks and temperatures of unit cells inside a planar SOFC stack were measured. The open circuit voltage testing of the stack and characterization of the interface between sealant and components suggested excellent sealing effect by applying the developed method. The effect of discharging direct‐current on temperature and temperature distribution inside the designed SOFC stack was investigated. The results showed that the discharging current had a great impact and the gas flow rate had a slight impact on the temperatures of unit cells. Temperature distribution of unit cells inside the stack was much non‐uniform and there is a significant temperature difference between various components of the stack and heating environment. The relationship between temperatures and cell performance showed that the worse the cell performance, the higher the cell surface temperature. When the stack was discharged at a constant current and the temperature of cell surface was over 950 °C, the higher the temperature, the more drop the corresponding voltage.
In recent years, concerns have escalated regarding eye health problems arising from Light-emitting diode (LED), which emits high-energy blue light (BL), potentially causing corneal epithelial dysfunctions (CEpD). Nevertheless, the mechanisms underlying this damage remain poorly comprehended. This study endeavors to explore the specific mechanisms through which BL exposure induces CEpD. The study carried out diverse assays and treatments to investigate the toxicological effects of BL exposure. 48 hours (h) of 440 nm of BL exposure decreased the migration of human corneal epithelial cells (hCEpCs) while augmenting reactive oxygen species (ROS) production and apoptosis. RNA-Sequencing and bioinformatic analysis indicated that cellular oxidation and reduction equilibrium, wound healing, the positive regulation of the apoptotic process, and the Phosphoinositide 3-kinase (PI3K)/AKT pathway were significantly influenced by BL exposure. Treatment with N-acetylcysteine (NAC), a ROS scavenger, restored cell viability and AKT/S6 kinase (S6K) activation, suggesting the involvement of ROS in BL-induced damage. NAC also reversed BL-induced apoptosis and migration. Blocking AKT/S6K replicated detrimental effects, while pre-treatment with SC79 (SC), an AKT activator, alleviated the changes caused by BL exposure in hCEpCs. Furthermore, in mice, the combination of AKT inhibition and BL exposure led to CEpD. However, treatment with SC and NAC restored CEpD caused by BL exposure. These results imply that the regulation of the ROS/PI3K/AKT/S6K axis is implicated in BL-induced CEpD. Collectively, this study offers insights into the molecular mechanisms of BL-induced CEpD and proposes targeting the ROS/PI3K/AKT/S6K cascade as a potential therapeutic approach. The findings contribute to ocular health knowledge and establish the basis for developing interventions to safeguard the cornea from the detrimental effects of excessive BL exposure.
Abstract This work investigates the effect of contact between electrodes and alloy interconnects on output performance of solid oxide fuel cell (SOFC) stacks. The measured maximum output power density ( p max ) of the unit cell increases from 0.07 to 0.1 W cm –2 by increasing the tip area of the interconnect from 40 to 60 cm 2 . The p max increases from 0.07 to 0.15 W cm –2 upon the addition of nickel foam and Ag mesh on the anode and cathode side, respectively. An additional (La 0.75 Sr 0.25 ) 0.95 MO 3–σ cathode current collecting layer is re‐printed on the original cathode current collecting layer, which aims to further improve the performance of the stack and individual cell. The performance of a 3‐cell short stack assembled by the cells with a new cathode current collecting layer is evaluated by measuring the current–voltage curve. The results indicate that the p max values of the stack and individual cells are enhanced from 0.07 to 0.37 W cm –2 and 0.15 to 0.5 W cm –2 at 850 °C, respectively. The performance of the whole stack and individual cells is greatly improved due to the interconnect embedded in the re‐printed new cathode current collecting layer.
Abstract The impactors on cell degradation inside planar SOFC stacks were investigated using both coated and uncoated Fe–16Cr alloys as the interconnects under stable operating conditions at 750 °C and thermal cycling conditions from 750 to 200 °C. It was found that cell degradation inside the stack is primarily dependent on the interfacial contact between the cathode current‐collecting layer and the interconnect. Additionally, cell degradation is found to be independent of the high‐temperature oxidation and Cr vaporization of the interconnects during stack operation, as the stacks are well sealed. The coating on the interconnect can further improve the contact between the cell cathode and the interconnect when the latter is properly embedded into the current‐collecting layer.
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